Toshiba Information Systems (Japan) Corporation
Optical inspection technology - OneShotBRDF™ -
Toshiba patented technology
Capture and visualize minute scratches and uneven flaws in one shot with proprietary scattered light detection technology
Capture inspection targets in one shot and visualize flaws in real time
Capture the faint scattered light reflected from scratches and dents in one shot by using optical inspection technology featuring a multiwavelength coaxial aperture filter that selects the reflection angle of light.
Visualize hard-to-capture microdefects. Can also inspect curved surfaces.
It color separates and visualizes microdefects that are difficult to capture with conventional cameras. It can also be used on inspection targets with curved surfaces, which are hard to capture stably.
| One-shot high-speed detection | (1-1000fps) |
|---|---|
| Resolution | (Minimum 3µm) |
| Unevenness depth | (≧10nm) |
| Curvature | (±18℃) |
Visualize hard-to-discern surface conditions and detect slight dirt and color irregularities
It also color separates and visualizes faint dirt, color irregularities, differing granularities and other differences in surface condition that are hard to discern with conventional cameras.
For appearance inspection equipment manufacturers
Surface Flaw Detection Scope
SFD240305A
The surface flaw detection scope "SFD240305A" uses Toshiba's patented technology "OneShotBRDF™" to detect flaws on flat surfaces in one shot.
*Surface Flaw Detection Scope is trademark of Toshiba Teli Corporation.
Surface Flaw Detection Scope - SFD240305A - [Toshiba Teli]